WK Data Logging | 英之科科技股份有限公司 | LCR Meter、DC Bias 直流重疊電流、阻抗分析儀

Overview

WK Data Logging is a software interface that connect with Wayne Kerr instruments. It is simple, yet powerful in running tests and retrieving test result. There are crucial features from setting, measuring, to exporting, plus guage and analysis mode switching modes

Two mode enables different functions and supports to be done by connecting with machine

Dashboard mode functions:

Single measurement
Repeat measurement
Save measurement data (USB key required)
Scan 2D barcode, new incremental measurement conditions, material information

Analysis mode supports:

Multiple sets of scan conditions
The way to draw a picture is to present the measured values
Frequency, voltage, current, time, and temperature sweep point (Sweep)
Compare differences under the same measurement conditions.

Data Sheet

Key Features

Dashboard Mode Features:

Single measurement
Repeat measurement
Load programming settings
Installation Edition Installation
Instrument viewing
End of batch measurement
Export Survey Results
Measure mode setting
Zero calibration

Analysis Mode Features:

Set measurement conditions and perform measurement
New delta testing conditions
Look for the resonant frequency
Toggle chart | Edit Chart
Supports setting of WK6565 as well as external power supply
Zero calibration
Save the scan condition settings
Load scan condition settings
Modify the measurement conditions
Delete a measurement condition
After scaling, it reverts back to the original curve
After the adjustment is scaled, the curve no longer appears in range
Display | Hide curves
Load stored data and present it as a curve
View the measured values
Save the graph
Alignment curve
Curve reduction/enlargement
Search for the peak value of the curve
The scale shows lg(x) / Linear
Clear all measurement results

Data Logging

Dashboard mode functions:

Single measurement

Repeat measurement

Save measurement data (USB key required)

Scan 2D barcode, new incremental measurement conditions, material information

Analysis mode supports:

Multiple sets of scan conditions

The way to draw a picture is to present the measured values

Frequency, voltage, current, time, and temperature sweep point (Sweep)

Compare differences under the same measurement conditions.